• DocumentCode
    2191125
  • Title

    A general class of lower bounds on the probability of error in multiple hypothesis testing

  • Author

    Routtenberg, Tirza ; Tabrikian, Joseph

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel
  • fYear
    2008
  • fDate
    3-5 Dec. 2008
  • Firstpage
    750
  • Lastpage
    754
  • Abstract
    In this paper, a new class of lower bounds on the probability of error for m-ary hypothesis tests is proposed. Computation of the minimum probability of error which is attained by the maximum a-posteriori probability (MAP) criterion, is usually not tractable. The new class is derived using Holder¿s inequality. The bounds in this class are continuous and differentiable function of the conditional probability of error and they provide good prediction of the minimum probability of error in multiple hypothesis testing. It is shown that for binary hypothesis testing problem this bound asymptotically coincides with the optimum probability of error provided by the MAP criterion. This bound is compared with other existing lower bounds in several typical detection and classification problems in terms of tightness and computational complexity.
  • Keywords
    computational complexity; error statistics; maximum likelihood estimation; statistical testing; Holder inequality; computational complexity; conditional probability; error probability; m-ary hypothesis tests; maximum a-posteriori probability; minimum probability; multiple hypothesis testing; Bayesian methods; Computational complexity; Computer errors; Entropy; Error probability; Maximum a posteriori estimation; Performance analysis; Statistical distributions; System analysis and design; Testing; MAP; detection; hypothesis testing; lower bounds; probability of error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel, 2008. IEEEI 2008. IEEE 25th Convention of
  • Conference_Location
    Eilat
  • Print_ISBN
    978-1-4244-2481-8
  • Electronic_ISBN
    978-1-4244-2482-5
  • Type

    conf

  • DOI
    10.1109/EEEI.2008.4736635
  • Filename
    4736635