2191355

Proceedings the Seventh IEEE European Test Workshop

2002

26-29 May 2002

automatic testing; built-in self test; data conversion; design for testability; electrical faults; integrated circuit testing; phase locked loops; BIST; DFT; PLL testing; SoC test; bridging faults; current test; data converter testing; defect based testing; delay testing; power conscious testing; system debug; system test;

English

ieee

Test Workshop, 2002. Proceedings. The Seventh IEEE European

Corfu, Greece

1530-1877

0-7695-1715-3

conf

10.1109/ETW.2002.1029631

1029631