DocumentCode
2191384
Title
Silicon technology advances and implications on test
Author
Spirakis, Greg
Author_Institution
Intel Corporation
fYear
2002
fDate
29-29 May 2002
Firstpage
3
Lastpage
3
Keywords
Circuit faults; Circuit testing; Failure analysis; Integrated circuit interconnections; LAN interconnection; Manufacturing processes; Microprocessors; Silicon; Transistors; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Workshop, 2002. Proceedings. The Seventh IEEE European
Conference_Location
Corfu, Greece
ISSN
1530-1877
Print_ISBN
0-7695-1715-3
Type
conf
DOI
10.1109/ETW.2002.1029632
Filename
1029632
Link To Document