Title :
Silicon technology advances and implications on test
Author_Institution :
Intel Corporation
Keywords :
Circuit faults; Circuit testing; Failure analysis; Integrated circuit interconnections; LAN interconnection; Manufacturing processes; Microprocessors; Silicon; Transistors; USA Councils;
Conference_Titel :
Test Workshop, 2002. Proceedings. The Seventh IEEE European
Conference_Location :
Corfu, Greece
Print_ISBN :
0-7695-1715-3
DOI :
10.1109/ETW.2002.1029632
