DocumentCode :
2191384
Title :
Silicon technology advances and implications on test
Author :
Spirakis, Greg
Author_Institution :
Intel Corporation
fYear :
2002
fDate :
29-29 May 2002
Firstpage :
3
Lastpage :
3
Keywords :
Circuit faults; Circuit testing; Failure analysis; Integrated circuit interconnections; LAN interconnection; Manufacturing processes; Microprocessors; Silicon; Transistors; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Workshop, 2002. Proceedings. The Seventh IEEE European
Conference_Location :
Corfu, Greece
ISSN :
1530-1877
Print_ISBN :
0-7695-1715-3
Type :
conf
DOI :
10.1109/ETW.2002.1029632
Filename :
1029632
Link To Document :
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