DocumentCode
2191396
Title
Activation properties of Schottky CdTe diodes irradiated by 150 MeV protons
Author
Murakami, Mio M. ; Kobayashi, Yoshihito ; Kokubun, Motohide ; Takahashi, Isao ; Okada, Yuu ; Kawaharada, Madoka ; Nakazawa, Kazuhiro ; Watanabe, Shin ; Sato, Goro ; Kouda, Manabu ; Mitani, Takefumi ; Takahashi, Tadayuki ; Suzuki, Masaya ; Tashiro, Makoto
Author_Institution
Dept. of Phys., Univ. of Tokyo, Japan
Volume
1
fYear
2002
fDate
10-16 Nov. 2002
Firstpage
269
Abstract
With its high stopping power, Cadmium Telluride (CdTe) has been regarded as a promising semiconductor material for the next generation X/γ-ray detectors, and improved significantly during this decade. In order to apply this device to astrophysics, it is essential to investigate the radiation hardness and background properties induced by cosmic-ray protons. We irradiated Schottky CdTe diodes and a CdTe block with a beam of mono-energetic (150 MeV) protons. The induced radio-activation in CdTe was measured externally with a germanium detector, and internally with the irradiated CdTe diode itself. We successfully identified most of radioactive isotopes induced mainly via (p, xn) reactions, and confirmed that activation background level of the CdTe diode is sufficiently low in orbit. We compared energy resolution and leakage current before and after the irradiation, and also monitored the signals from a calibration source during the irradiation. There have been no significant degradation. CdTe diodes are enough tolerant to radioactivity in orbit.
Keywords
II-VI semiconductors; X-ray detection; cadmium compounds; gamma-ray detection; leakage currents; proton effects; semiconductor counters; wide band gap semiconductors; CdTe; Schottky CdTe diodes; activation background level; activation properties; background properties; calibration source; cosmic-ray protons; mono-energetic protons; next generation X-ray detectors; next generation gamma-ray detectors; radiation hardness; radioactivity; Astrophysics; Cadmium compounds; Extraterrestrial measurements; Gamma ray detection; Gamma ray detectors; Particle beams; Protons; Schottky diodes; Semiconductor diodes; Semiconductor materials;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium Conference Record, 2002 IEEE
Print_ISBN
0-7803-7636-6
Type
conf
DOI
10.1109/NSSMIC.2002.1239314
Filename
1239314
Link To Document