DocumentCode :
2191445
Title :
Automated Assessment System for Subjective Questions Based on LSI
Author :
Hu, Xinming ; Xia, Huosong
Author_Institution :
Coll. of Econ. & Manage., Wuhan Univ. of Sci. & Eng., Wuhan, China
fYear :
2010
fDate :
2-4 April 2010
Firstpage :
250
Lastpage :
254
Abstract :
Subjective question is capable of examining the adopting ability of knowledge of the student, but the assessment for it suffers from a number of questions such as trickiness, synonymy and polysemy. This reduces the advantage of subjective question for online exercise. In this paper we explore an approach to automated assessment system for subjective question based on latent semantic indexing. Chinese automatic segmentation techniques and subject ontology are used for transferring the reference answers to a term-document matrix, which is then projected to a k-dimensional LSI space by the statistical technique singular value decomposition to solve the problem of synonymy and polysemy. A reference unit vector is introduced to alleviate the problem of trickiness. The system then concludes the quality of the solution according to the similarity between the projected vectors. The experimental results prove the feasibility of our theoretical architecture and flow for automated assessment of subjective question.
Keywords :
document handling; ontologies (artificial intelligence); singular value decomposition; LSI; automated assessment system; singular value decomposition; statistical technique; subjective questions; term-document matrix; Educational institutions; Engineering management; Feedback; Indexing; Informatics; Information security; Information technology; Internet; Large scale integration; Ontologies; Latent Semantic Indexing; Ontology; TF-IDF; subjective question; unit vector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology and Security Informatics (IITSI), 2010 Third International Symposium on
Conference_Location :
Jinggangshan
Print_ISBN :
978-1-4244-6730-3
Electronic_ISBN :
978-1-4244-6743-3
Type :
conf
DOI :
10.1109/IITSI.2010.76
Filename :
5453573
Link To Document :
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