DocumentCode
2191632
Title
A framework for evaluating the performance of bipolar power transistor drive circuits
Author
Ellis, Julie ; Burns, William
Author_Institution
Digital Equipment Corporation, Marlboro, Massachusetts, 01752
fYear
1983
fDate
6-9 June 1983
Firstpage
325
Lastpage
337
Abstract
A structured method for evaluating bipolar power transistor base drive circuitry is presented. Techniques used to generate the data required for the evaluation are also presented. Experimental measurements, theoretical analyses and computer simulations, which include parasitic elements and the effects of component variations, are the basis for the evaluation. Two examples illustrate the structured method of evaluating and comparing base drive circuits.
Keywords
Circuit optimization; Ice; Integrated circuit reliability; Power supplies; Power transistors; Switching circuits; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 1983 IEEE
Conference_Location
Albuquerque, New Mexico, USA
ISSN
0275-9306
Type
conf
DOI
10.1109/PESC.1983.7069872
Filename
7069872
Link To Document