• DocumentCode
    2191844
  • Title

    SEPL: Smart Evicted Page List Buffer for NAND Flash Storage System

  • Author

    Jin, Xin ; Jung, Sanghyuk ; Song, Yong Ho

  • Author_Institution
    Dept. of Electron. & Comput. Eng., Hanyang Univ., Seoul, South Korea
  • fYear
    2010
  • fDate
    June 29 2010-July 1 2010
  • Firstpage
    1687
  • Lastpage
    1694
  • Abstract
    NAND flash memory has become popular in the consumer market while its success in main storage market is still limited. One of the reasons is that NAND flash suffers severe performance degradation under random write requests, and these requests are inevitable since the complexity of the applications is growing rapidly. One way to mitigate the problem is by applying DRAM as the buffer between host and NAND flash to absorb these requests, and numbers of buffer management schemes such as CFLRU and FARS had been proposed. However, these algorithms do not respect write intensive and long-term pages enough. In this paper, we propose a buffer replacement algorithm with a smart eviction list and a brand new eviction criterion that helps retaining the write intensive pages in the buffer in order to lower down the number of write request into NAND flash memory. Experiments show that SEPL outperforms other algorithms in the traces where random access is dominant.
  • Keywords
    NAND circuits; buffer storage; flash memories; CFLRU; DRAM; FARS; NAND flash memory; NAND flash storage system; SEPL; buffer management schemes; buffer replacement algorithm; smart evicted page list buffer; write intensive pages; write requests; Algorithm design and analysis; Buffer storage; File systems; Flash memory; Google; Pollution; Random access memory; NAND flash; buffer cache; long-term; metadata; random access; replacement; storage system; write intensive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology (CIT), 2010 IEEE 10th International Conference on
  • Conference_Location
    Bradford
  • Print_ISBN
    978-1-4244-7547-6
  • Type

    conf

  • DOI
    10.1109/CIT.2010.297
  • Filename
    5577961