DocumentCode :
2192155
Title :
Bit-Error-Rate of LDPC coded QAM in the presence of a residual phase noise process and a non-linear distortion
Author :
Aviv, Yitzhak ; Rosenhouse, Isaac
Author_Institution :
Ceragon Networks, Tel Aviv, Israel
fYear :
2008
fDate :
3-5 Dec. 2008
Firstpage :
175
Lastpage :
179
Abstract :
In this paper we present an analysis of the Bit Error Rate (BER) of LDPC-coded-QAM systems in an Additive-White-Gaussian-Noise (AWGN) channel impaired by a residual Phase-Noise (PN) process and a Nonlinear (NL) distortion. We start by deriving expressions for the Mean-Square-Error (MSE) caused by these common impairments. The BER is calculated separately for the coded bits and the uncoded bits, in a coded modulation scheme. In the first case, the MSE is added to the channel noise variance. As a consequence, the BER curve, which is assumed to be known, is shifted and an error floor is generated. The BER of the uncoded bits is calculated directly from the phase noise variance, the channel SNR and the nonlinear distortion which affects the distance between constellation points. Simulation results using an LDPC code validate the derivations.
Keywords :
AWGN channels; channel coding; error statistics; mean square error methods; modulation coding; nonlinear distortion; parity check codes; phase noise; quadrature amplitude modulation; residue codes; AWGN channel; BER; LDPC coded QAM system; MSE; additive-white-Gaussian-noise; bit-error-rate; channel noise variance; mean-square-error; nonlinear distortion; residual phase noise process; AWGN; Additive white noise; Bit error rate; Gaussian noise; Modulation coding; Nonlinear distortion; Parity check codes; Phase distortion; Phase noise; Quadrature amplitude modulation; Nonlinear Distortion; Phase Noise; Quadrature Amplitude Modulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical and Electronics Engineers in Israel, 2008. IEEEI 2008. IEEE 25th Convention of
Conference_Location :
Eilat
Print_ISBN :
978-1-4244-2481-8
Electronic_ISBN :
978-1-4244-2482-5
Type :
conf
DOI :
10.1109/EEEI.2008.4736682
Filename :
4736682
Link To Document :
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