• DocumentCode
    2192171
  • Title

    Irregular growth of PECVD-Ti silicide film on doped Si substrates

  • Author

    Tai, Kaori ; Harada, Yusuke ; Matsumoto, Muneyuki ; Oki, Hisanori

  • Author_Institution
    LSI Production Division, Oki Electric Industry Co., Ltd., Tokyo, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    64
  • Lastpage
    66
  • Keywords
    Chemical industry; Large scale integration; Production; Scanning electron microscopy; Semiconductor films; Silicides; Sputtering; Substrates; Surface morphology; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Interconnect Technology Conference, 2000. Proceedings of the IEEE 2000 International
  • Print_ISBN
    0-7803-6327-2
  • Type

    conf

  • DOI
    10.1109/IITC.2000.854283
  • Filename
    854283