DocumentCode :
2192548
Title :
Micro motion at the failed contact interfaces
Author :
He, Zhanping ; Liangjun Hu
Author_Institution :
Beijing Univ. of Posts & Telecommun., China
fYear :
2005
fDate :
26-28 Sept. 2005
Firstpage :
180
Lastpage :
185
Abstract :
On inspection of failed connector´s contacts, various wear tracks of micro motion are found. The tracks appear as straight line, curve and twisting. The effect of micro motion not only produces wear debris of contact metals and their oxidation products, but also grabbles and accumulates contaminants which cause high and fluctuated contact resistance. Analysis on the cause of micro motion that related to external vibration and shocks are carried out. Supporting experimental results are also discussed.
Keywords :
contact resistance; contamination; electric connectors; electrical contacts; failure analysis; inspection; wear; contact failure; contact interface failure; contact metals; contact resistance; contaminant accumulation; external vibrations; micro motion; oxidation products; wear debris; wear tracks; Connectors; Contact resistance; Gold; Inspection; Motion analysis; Nickel; Oxidation; Springs; Surface morphology; Tracking;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 2005. Proceedings of the Fifty-First IEEE Holm Conference on
Print_ISBN :
0-7803-9113-6
Type :
conf
DOI :
10.1109/HOLM.2005.1518242
Filename :
1518242
Link To Document :
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