DocumentCode :
2192614
Title :
Emotion Recognition of Electromyography Based on Support Vector Machine
Author :
Yang Guangying ; Yang Shanxiao
Author_Institution :
Sch. of Phys. & Electron. Eng., Taizhou Univ., Taizhou, China
fYear :
2010
fDate :
2-4 April 2010
Firstpage :
298
Lastpage :
301
Abstract :
Recently, computer scientists have realized the importance of emotions in human interactions with the environment. Psychophysiological studies of emotion have typically used static simulation to elicit emotion. In this paper an analysis of the properties of four Electromyography (EMG) signals employed in emotion recognition is presented. Experiment analyzes wavelet transform of surface Electromyography (EMG) to extract the maximum and minimum multi-scale wavelet coefficients firstly. And then we enter the two kinds of structural feature vector classifier for emotion recognition. Class separation analysis was used for determining the best physiological parameters to use for recognizing emotional states. Experimental results showed that using Support Vector Machine (SVM) for improving cluster separation the emotional patterns provided the best results.
Keywords :
electromyography; emotion recognition; medical image processing; support vector machines; wavelet transforms; class separation analysis; electromyography signals; emotion recognition; maximum multiscale wavelet coefficient extraction; minimum multiscale wavelet coefficient extraction; psychophysiological study; structural feature vector classifier; support vector machine; wavelet transform; Computational modeling; Electromyography; Emotion recognition; Humans; Psychology; Signal analysis; Support vector machine classification; Support vector machines; Wavelet analysis; Wavelet transforms; Emotional Recognition; Support Vector Machine (SVM); Surface Electromyography (EMG) Signal; Wavelet Transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Information Technology and Security Informatics (IITSI), 2010 Third International Symposium on
Conference_Location :
Jinggangshan
Print_ISBN :
978-1-4244-6730-3
Electronic_ISBN :
978-1-4244-6743-3
Type :
conf
DOI :
10.1109/IITSI.2010.122
Filename :
5453620
Link To Document :
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