DocumentCode :
2192617
Title :
A multi-GHz, multi-channel transient waveform digitization integrated circuit
Author :
Kleinfelder, Stuart
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
Volume :
1
fYear :
2002
fDate :
10-16 Nov. 2002
Firstpage :
544
Abstract :
A series of multi-channel transient waveform digitization integrated circuits with up to 5 GHz sample rates and parallel 10-bit digitization has been designed, tested, and fabricated in large quantities. The current CMOS circuit uses four arrays of 128 fast switched capacitors per channel to record four parallel analog transient inputs. Triggering and clocking is provided by an analogically-adjustable asynchronous active delay line that uses look-ahead to generate 128 multi-GHz 4-way interleaved clocks without the need for external high-speed clocking. After transient capture, each channel is fed into 128 parallel 10-bit analog to digital converters for fast, channel-parallel digitization, followed by digital readout. The fast triggering and waveform capture, channel-parallel digitization and convenient word-parallel digital readout results in a responsive and low dead-time system. Acquisition sample rates range from ∼50 kHz to ∼3 GHz. Analog input bandwidth was measured to be ∼350 MHz. Temporal noise is typically equivalent to ∼1 mV RMS, for a signal to noise ratio of ∼2,500:1, RMS. Fixed-pattern spatial noise, after on-chip digitization, is equivalent to ∼5 mV, RMS. Current efforts to improve this technology will yield larger array sizes, sample rates in excess of 10 GHz, analog bandwidth exceeding I GHz, higher conversion rates, lower dead-time, and enhanced flexibility.
Keywords :
CMOS analogue integrated circuits; analogue-digital conversion; application specific integrated circuits; capacitors; delay lines; nuclear electronics; readout electronics; trigger circuits; 350 MHz; 50 kHz to 3 GHz; CMOS circuit; analogically-adjustable asynchronous active delay line; clocking; conversion rates; digital readout; low dead-time system; multichannel transient waveform digitization integrated circuit; on-chip digitization; parallel analog transient inputs; sample rates; switched capacitors; temporal noise; triggering; Analog-digital conversion; Bandwidth; CMOS analog integrated circuits; Circuit testing; Clocks; Delay lines; Integrated circuit testing; Signal to noise ratio; Switched capacitor circuits; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2002 IEEE
Print_ISBN :
0-7803-7636-6
Type :
conf
DOI :
10.1109/NSSMIC.2002.1239372
Filename :
1239372
Link To Document :
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