Title :
Exploiting inherent information redundancy to manage transient errors in NoC routing arbitration
Author :
Yu, Qiaoyan ; Zhang, Meilin ; Ampadu, Paul
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Rochester, Rochester, NY, USA
Abstract :
We exploit the inherent information redundancy in the control path of Networks-on-Chip (NoCs) routers to manage transient errors, preventing packet loss and misrouting. Unlike fault-tolerant routing, our method does not drop packets when faults occur in routers and thus does not increase the burden on neighboring routers. Unlike the NoC interconnect links, the routing operation is nonlinear and standard error control coding methods cannot be used. Instead, our method exploits existing information redundancy in the router, significantly reducing the area overhead and power consumption compared to triple-modular redundancy (TMR). An analytical reliability model of our method is provided, including parameters such as circuit size, different error rates for logic gates and registers, and the location of a faulty element. Compared to TMR, the proposed method improves the arbiter reliability by two orders of magnitude while reducing the total power and area by 43% and 64%, respectively. Simulations performed on a 4×4 NoC show that our method reduces the average latency by up to 90% and 12% over no-protection and TMR methods, respectively.
Keywords :
error correction codes; integrated circuit reliability; logic gates; network routing; network-on-chip; NoC interconnect links; NoC routers; NoC routing arbitration; TMR; analytical reliability model; arbiter reliability; area overhead; control path; fault-tolerant routing; faulty element location; inherent information redundancy; logic gates; neighboring routers; networks-on-chip routers; nonlinear routing operation; packet loss misrouting; packet loss prevention; power consumption; registers; standard error control coding methods; transient error management; triple-modular redundancy; Error correction; Logic gates; Redundancy; Registers; Routing; Transient analysis; Tunneling magnetoresistance; Networks-on-chip; arbiter; fault tolerant; information redundancy; on-chip interconnect; reliability; transient error; triple-modular redundancy;
Conference_Titel :
Networks on Chip (NoCS), 2011 Fifth IEEE/ACM International Symposium on
Conference_Location :
Pittsburgh, PA
Electronic_ISBN :
978-1-4503-0720-8