Title :
Energy and reliability oriented mapping for regular Networks-on-Chip
Author :
Ababei, Cristinel ; Kia, Hamed Sajjadi ; Yadav, Om Prakash ; Hu, Jingcao
Author_Institution :
Electr. & Comput. Eng., North Dakota State Univ., Fargo, ND, USA
Abstract :
We formulate the problem of energy consumption and reliability oriented application mapping on regular Network-on-Chip topologies. We propose a novel branch-and-bound based algorithm to solve this problem. Reliability is estimated by an efficient Monte Carlo algorithm based on the destruction spectrum of the network. Simulation results demonstrate that reliability can be improved without sacrificing much of energy consumption.
Keywords :
Monte Carlo methods; circuit reliability; network-on-chip; tree searching; Monte Carlo algorithm; branch-and-bound based algorithm; energy consumption; network-on-chip; reliability oriented mapping; Computer architecture; Computer network reliability; Equations; Mathematical model; Reliability; Routing; Tiles; Regular Network-on-Chip mapping; energy; reliability;
Conference_Titel :
Networks on Chip (NoCS), 2011 Fifth IEEE/ACM International Symposium on
Conference_Location :
Pittsburgh, PA
Electronic_ISBN :
978-1-4503-0720-8