DocumentCode
2192918
Title
Contact resistance characteristics of high temperature superconducting bulk. Part IV
Author
Fujita, Hiroyuki ; Imaizumi, Takuya ; Tomita, Masaru ; Sakai, Naomichi ; Murakami, Masato ; Hirabayashi, Izumi ; Sawa, Koichiro
Author_Institution
Dept. of Syst. Design Eng., Keio Univ., Yokohama, Japan
fYear
2005
fDate
26-28 Sept. 2005
Firstpage
272
Lastpage
276
Abstract
The authors have measured contact resistances between two bulk YBCO superconductor blocks for the application to a persistent current switch (PCS). In order to reduce a contact resistance, we deposited indium and silver on the sample surfaces. The resistance was reduced by increasing the thickness of the deposited metal layers, but it saturated when the thickness reached a certain level. The saturation thickness was much smaller in indium than silver. Such a difference is understandable by considering the hardness of these two metals. The resistance was also reduced by increasing the mechanical load. Overloading however caused the adhesion of metal layers, resulting in the peeling off of the deposited layers when the switch was opened. Additionally, the contact area of the switch was analyzed with finite element method (FEM). This analysis result may lead to the elucidation of a contact mechanism with the contact surfaces deposited metal.
Keywords
barium compounds; contact resistance; finite element analysis; high-temperature superconductors; indium; persistent currents; silver; superconducting switches; yttrium compounds; FEM; In-Ag; YBCO superconductor blocks; YBa2Cu3O7; contact area; contact mechanism; contact resistance; finite element method; high temperature superconducting bulk; mechanical load; metal layers; persistent current switch; saturation thickness; Contact resistance; Current measurement; Electrical resistance measurement; High temperature superconductors; Indium; Persistent currents; Silver; Superconducting epitaxial layers; Switches; Yttrium barium copper oxide;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Contacts, 2005. Proceedings of the Fifty-First IEEE Holm Conference on
Print_ISBN
0-7803-9113-6
Type
conf
DOI
10.1109/HOLM.2005.1518256
Filename
1518256
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