Title :
Two-dimensional mapping of amplitude and phase of microwave fields inside a MMIC using the direct electro-optic sampling technique
Author :
Mertin, W. ; Leyk, A. ; David, G. ; Bertenburg, R.M. ; Kosslowski, S. ; Tegude, F.J. ; Wolff, I. ; Jager, D. ; Kubalek, E.
Author_Institution :
Werkstoffe der Elektrotechnik, Univ. Duisberg, Germany
Abstract :
For the first time, two-dimensional mappings representing both the amplitude and the phase of microwave fields inside a traveling-wave amplifier (TWA) are presented. The direct electro-optic sampling technique has been used for these measurements. Comparing amplitude and phase mappings at different frequencies the spatially and frequency resolved behaviour of the normal electric field component inside the TWA can be studied.<>
Keywords :
MMIC; electro-optical effects; integrated circuit testing; microwave amplifiers; microwave measurement; travelling-wave-tubes; MMIC; amplitude; direct electro-optic sampling; electric field; microwave fields; phase; traveling-wave amplifier; two-dimensional mapping; Frequency; Microwave amplifiers; Sampling methods; Spatial resolution;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335268
