DocumentCode
2193182
Title
Calibrated electro-optic measurements of a MMIC
Author
Le Quang, D. ; Erasme, D. ; Huyart, B.
Author_Institution
Dept. Communications, Ecole Nat. Superieure des Telecommun., Paris, France
fYear
1994
fDate
23-27 May 1994
Firstpage
1593
Abstract
An electro-optic probing technique using a continuous-light semiconductor-laser beam and a fast photodetector is developed for measuring the S-parameters of industrial MMICs. A comparison with network analyser measurements is shown. The calibration problem is solved in a simple manner by the presence of a Fabry-Perot effect.<>
Keywords
MMIC; S-parameters; calibration; electro-optical effects; integrated circuit testing; measurement by laser beam; microwave reflectometry; Fabry-Perot effect; S-parameters; continuous-light semiconductor-laser beam; electro-optic probing; fast photodetector; industrial MMICs; measurement calibration; Calibration; Fabry-Perot; MMICs; Photodetectors; Scattering parameters;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location
San Diego, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1778-5
Type
conf
DOI
10.1109/MWSYM.1994.335269
Filename
335269
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