Title :
Calibrated electro-optic measurements of a MMIC
Author :
Le Quang, D. ; Erasme, D. ; Huyart, B.
Author_Institution :
Dept. Communications, Ecole Nat. Superieure des Telecommun., Paris, France
Abstract :
An electro-optic probing technique using a continuous-light semiconductor-laser beam and a fast photodetector is developed for measuring the S-parameters of industrial MMICs. A comparison with network analyser measurements is shown. The calibration problem is solved in a simple manner by the presence of a Fabry-Perot effect.<>
Keywords :
MMIC; S-parameters; calibration; electro-optical effects; integrated circuit testing; measurement by laser beam; microwave reflectometry; Fabry-Perot effect; S-parameters; continuous-light semiconductor-laser beam; electro-optic probing; fast photodetector; industrial MMICs; measurement calibration; Calibration; Fabry-Perot; MMICs; Photodetectors; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335269
