Title :
Using the excitation surface plasma waves of Kretschmann configuration to the normal saline measurement
Author :
Lee, Cheng-Min ; Chang, Chia-Hao ; Liu, Shun-Wen ; Chou, Pei-Wen ; Jheng, Yu-Si ; Wu, Tian-Fu ; Lan, Jyun-Ming ; Wu, Hung-Tze
Author_Institution :
Dept. of Electron. Eng., Ching Yun Univ., Jhongli, Taiwan
Abstract :
This study is using Optical Frustrated Total Internal Reflection method and Kretschmann configuration to excite surface plasma waves . When the Surface Plasma Wave measurement system to reaction of normal saline, We can find the corresponding point of the surface plasmon resonance and absorption depth and bandwidth.
Keywords :
organic compounds; plasma waves; reflectivity; surface plasmon resonance; Kretschmann configuration; absorption bandwidth; absorption depth; excitation surface plasma waves; normal saline measurement; optical frustrated total internal reflection method; surface plasmon resonance; Films; Metals; Optical reflection; Optical surface waves; Plasma waves; Surface waves; Kretschmann configuration; Optical Frustrated Total Internal Reflection method; Saline; Surface Plasma Waves(SPW);
Conference_Titel :
Electronics, Communications and Control (ICECC), 2011 International Conference on
Conference_Location :
Ningbo
Print_ISBN :
978-1-4577-0320-1
DOI :
10.1109/ICECC.2011.6067634
