• DocumentCode
    2193412
  • Title

    Learning Robust Bayesian Network Classifiers in the Space of Markov Equivalent Classes

  • Author

    Wang, Zhongfeng ; Wang, Zhihai ; Fu, Bin

  • Author_Institution
    Sch. of CSE, Beijing Jiaotong Univ., Beijing, China
  • fYear
    2010
  • fDate
    13-13 Dec. 2010
  • Firstpage
    891
  • Lastpage
    898
  • Abstract
    Restricted Bayesian network is an efficient classification model. However, so far some researchers still attempt to improve the performance by considering directions of edges, because traditional learning method merely takes into account log likelihood, which is not suitable for learning classifiers, when learning a tree topological structure. In this paper, we analyze the search spaces and the equivalent classes spaces of this kind of classifiers. Accordingly, we point out they are robust on structure learning because that the directions of their edges do not play a role in maximizing log conditional likelihood. For application, we propose a novel framework for learning these kind of classifiers. Finally, we run experiments on Weka platform using 45 problems from the University of California at Irvine repository. Experimental results show classification accuracy and stability do not change statistically in our learning framework.
  • Keywords
    Markov processes; belief networks; equivalence classes; learning (artificial intelligence); pattern classification; search problems; trees (mathematics); Markov equivalent classes; University of California at Irvine repository; Weka platform; classification accuracy; classification model; equivalent classes spaces; learning classifiers; log conditional likelihood; log likelihood; robust Bayesian network classifiers; search spaces; structure learning; traditional learning method; tree topological structure; Bayesian network; TAN classifier; equivalent classes; learning; restricted Bayesian network classifier;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Data Mining Workshops (ICDMW), 2010 IEEE International Conference on
  • Conference_Location
    Sydney, NSW
  • Print_ISBN
    978-1-4244-9244-2
  • Electronic_ISBN
    978-0-7695-4257-7
  • Type

    conf

  • DOI
    10.1109/ICDMW.2010.91
  • Filename
    5693390