• DocumentCode
    2193499
  • Title

    A high density self-aligned 4-mask planar VDMOS process

  • Author

    Kinzer, D. ; Ajit, J.S. ; Wagers, K. ; Asselanis, D.

  • Author_Institution
    Int. Rectifier Corp., El Segundo, CA, USA
  • fYear
    1996
  • fDate
    20-23 May 1996
  • Firstpage
    243
  • Lastpage
    246
  • Abstract
    The fifth generation HEXFET technology achieves its industry leading performance by using innovative self-alignment processes to improve manufacturing precision while cutting the number of process steps. It is a scaled down form of the dominant planar DMOS technology and requires only four masks to build. The self-alignment allows junction depths and feature sizes 30-40% smaller than previous generations. This is especially critical for power FETs with voltage ratings of 100 V or below, since so much of the on-resistance is determined by the width, length, and carrier mobility of the MOS channel. The shallow base greatly reduces JFET resistance while the heavy doping reduces base resistance to enhance ruggedness
  • Keywords
    MIS devices; carrier mobility; masks; power semiconductor devices; semiconductor technology; HEXFET technology; JFET resistance; base resistance; carrier mobility; feature sizes; junction depths; manufacturing precision; masks; planar VDMOS process; self-alignment processes; voltage ratings; Capacitance; Doping; Electrodes; FETs; Insulation; Manufacturing industries; Manufacturing processes; Rectifiers; Telephony; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1996. ISPSD '96 Proceedings., 8th International Symposium on
  • Conference_Location
    Maui, HI
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-3106-0
  • Type

    conf

  • DOI
    10.1109/ISPSD.1996.509491
  • Filename
    509491