• DocumentCode
    2193588
  • Title

    Punchthrough type GTO with buffer layer and homogeneous low efficiency anode structure

  • Author

    Eicher, S. ; Bauer, F. ; Weber, A. ; Zeller, H.R. ; Fichtner, W.

  • Author_Institution
    Integrated Syst. Lab., Swiss Federal Inst. of Technol., Zurich, Switzerland
  • fYear
    1996
  • fDate
    20-23 May 1996
  • Firstpage
    261
  • Lastpage
    264
  • Abstract
    A new type of full scale 4.5 kV/3 kA GTO has been developed, fabricated, and electrically characterized. The device utilizes a punchthrough concept with a buffer layer. To avoid the requirement of excessive gate currents for turn-on, the new GTO has a homogeneous anode layer without shorts. The anode has a very low efficiency, which allows efficient extraction of charge during turn-off. With the buffer layer, the new device has a significantly reduced wafer thickness as compared to conventional devices without buffer. This reduces switching as well as on-state losses. The turn-off losses of the best devices were reduced to one third of those of conventional GTOs and, at the same time, the on-state losses were decreased by more than one third
  • Keywords
    losses; power semiconductor switches; thyristors; 3 kA; 4.5 kV; buffer layer; homogeneous low efficiency anode structure; on-state losses; punchthrough type GTO; switching losses; turn-off losses; wafer thickness; Anodes; Buffer layers; Cathodes; Charge carrier processes; Electrons; Silicon; Solids; Thyristors; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs, 1996. ISPSD '96 Proceedings., 8th International Symposium on
  • Conference_Location
    Maui, HI
  • ISSN
    1063-6854
  • Print_ISBN
    0-7803-3106-0
  • Type

    conf

  • DOI
    10.1109/ISPSD.1996.509495
  • Filename
    509495