DocumentCode :
2193610
Title :
Two-dimensional analysis of surge response in thyristor lightning surge protection devices
Author :
Satoh, Hidetaka ; Shimoda, Yoshio
Author_Institution :
NTT Interdisciplinary Res. Labs., Tokyo, Japan
fYear :
1996
fDate :
20-23 May 1996
Firstpage :
265
Lastpage :
268
Abstract :
The dynamics of surge response, which influences surge-handling capability, for thyristor lightning surge protection devices were investigated by a two-dimensional numerical device simulation. Maximum power dissipation appears in the open-base avalanche transistor operation at turn-on. The power dissipation increases by a few orders of magnitude with increase in the input surge. On the other hand, turn-on time is shorter and changes by less than one order of magnitude, caused by the field-aiding effect. As a result, the energy dissipation, which converts to self-heating and influences surge-handling capability, increases with increase in the input surge. To improve surge-handling capability by designing for low energy dissipation, fast switching time is effective for the open-base avalanche transistor which has narrow base width and uses a thin substrate with large carrier lifetime
Keywords :
lightning; semiconductor device models; surge protection; telecommunication equipment; thyristor applications; thyristors; energy dissipation; field-aiding effect; lightning surge protection devices; open-base avalanche transistor operation; power dissipation; surge response; surge-handling capability; switching time; thyristor applications; turn-on time; two-dimensional numerical device simulation; Energy dissipation; Impurities; Laboratories; Lightning; Power dissipation; Surge protection; Surges; Switches; Thyristors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Semiconductor Devices and ICs, 1996. ISPSD '96 Proceedings., 8th International Symposium on
Conference_Location :
Maui, HI
ISSN :
1063-6854
Print_ISBN :
0-7803-3106-0
Type :
conf
DOI :
10.1109/ISPSD.1996.509496
Filename :
509496
Link To Document :
بازگشت