Title :
Monolithic integration of the vertical IGBT and intelligent protection circuits
Author :
Shen, Z. John ; Robb, Stephen P.
Author_Institution :
Power Products Div., Motorola Inc., Phoenix, AZ, USA
Abstract :
In this paper, we have developed a new smart discrete technology to monolithically integrate the high voltage vertical IGBT with low-voltage NMOS protection circuitry by adding a p-well step to the conventional IGBT process. Two new 600 V intelligent IGBTs, based on the same technology but using different protection schemes, are reported for the first time. The first intelligent IGBT provides protection against over-current and over-temperature conditions. The second intelligent IGBT provides protection against short circuit conditions by means of sensing collector voltage. The typically observed characteristics of the intelligent IGBT´s include a forward voltage of 1.4 V at a current density of 100 A/cm2, a turn-off fall time of 200 ns, and a short-circuit withstand time at 125°C of more than 50 μs
Keywords :
MOS integrated circuits; insulated gate bipolar transistors; intelligent networks; overcurrent protection; overvoltage protection; power semiconductor switches; protection; short-circuit currents; 1.4 V; 125 C; 200 ns; 50 mus; 600 V; current density; intelligent IGBT; intelligent protection circuits; low-voltage NMOS protection circuit; monolithic integration; over-current; over-temperature; p-well step; short-circuit withstand time; smart discrete technology; turn-off fall time; vertical IGBT; Diodes; Fault detection; Insulated gate bipolar transistors; MOSFETs; Monolithic integrated circuits; Protection; Resistors; Silicon; Temperature sensors; Threshold voltage;
Conference_Titel :
Power Semiconductor Devices and ICs, 1996. ISPSD '96 Proceedings., 8th International Symposium on
Conference_Location :
Maui, HI
Print_ISBN :
0-7803-3106-0
DOI :
10.1109/ISPSD.1996.509501