• DocumentCode
    2193751
  • Title

    Coplanar on-wafer matching structures tunable by RF-probe position

  • Author

    Schmukler, B.C.

  • Author_Institution
    Watkins-Johnson Co., Palo Alto, CA, USA
  • fYear
    1994
  • fDate
    23-27 May 1994
  • Firstpage
    1481
  • Abstract
    On-wafer coplanar matching structures have been designed and fabricated that are tunable by RF-probe position. They are particularly suited for input matching FETs and overcome the matching problem caused by RF-probe attenuation. The approximate size at 18 GHz is 1 mm.<>
  • Keywords
    MMIC; impedance matching; integrated circuit testing; microstrip components; microwave measurement; probes; tuning; 1 mm; 18 GHz; FET input matching; RF-probe attenuation; RF-probe position; coplanar on-wafer structures; onwafer coplanar matching structures; Attenuation; FETs; Impedance matching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1994., IEEE MTT-S International
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1778-5
  • Type

    conf

  • DOI
    10.1109/MWSYM.1994.335295
  • Filename
    335295
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2193751