• DocumentCode
    2193856
  • Title

    Low voltage power system surge overvoltage protection

  • Author

    Paul, Dev

  • Author_Institution
    2101 Webster St., Oakland, CA, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    21
  • Lastpage
    29
  • Abstract
    The unpredictable threat of transient overvoltages is ever increasing in today´s low voltage power supplies for every aspect of industry. To calculate the magnitude, duration and energy of such transient overvoltages is not an easy task. Some loads are becoming very sensitive to such overvoltages, thereby creating a challenge for the application engineer to design a reliable power supply system. To apply surge overvoltage mitigation devices requires technical knowledge to understand their application limitations and configuration within a power system. Technical overview of fundamentals of transients and associated noise is presented. The importance of understanding applicable UL, IEEE and IEC Standards, and thorough review of manufacturers´ data on transient voltage surge suppressors (TVSS) is included. TVSS testing requirements per Second edition of UL 1449 is presented. An overview of how to design a low voltage power supply system to suppress transient overvoltages is included
  • Keywords
    IEC standards; IEEE standards; overvoltage protection; power system protection; power system transients; surge protection; IEC Standards; IEEE Standards; Second edition of UL 1449; UL Standards; low voltage power system; noise; surge overvoltage mitigation devices; surge overvoltage protection; transient overvoltages; transient voltage surge suppressors testing; Design engineering; Electricity supply industry; Low voltage; Power supplies; Power system protection; Power system reliability; Power system transients; Reliability engineering; Surge protection; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial and Commercial Power Systems Technical Conference, 2000. Conference Record. Papers Presented at the 2000 Annual Meeting. 2000 IEEE
  • Conference_Location
    Clearwater, FL
  • Print_ISBN
    0-7803-5843-0
  • Type

    conf

  • DOI
    10.1109/ICPS.2000.854353
  • Filename
    854353