• DocumentCode
    2193876
  • Title

    Current signatures for production testing [CMOS ICs]

  • Author

    Gattiker, A. ; Nigh, P. ; Grosch, D. ; Maly, W.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    1996
  • fDate
    24-25 Oct. 1996
  • Firstpage
    25
  • Lastpage
    28
  • Abstract
    The concept of the current signature has been proposed as a means for improving testing resolution over single-threshold Iddq testing. This paper postulates a practical methodology for applying the current signature concept for die selection in a production environment.
  • Keywords
    CMOS integrated circuits; electric current measurement; integrated circuit testing; leakage currents; production testing; CMOS ICs; current signature; die selection; production environment; production testing; single-threshold Iddq testing; testing resolution; Circuit faults; Current measurement; Microelectronics; Performance evaluation; Production; Sorting; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IDDQ Testing, 1996., IEEE International Workshop on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-8186-7655-8
  • Type

    conf

  • DOI
    10.1109/IDDQ.1996.557804
  • Filename
    557804
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2193876