Title :
A novel model for activation energy calculation in progressive-stress accelerated test
Author :
Min, Guo ; Changzhi, Lv ; Xianlei, Meng ; Weidong, Ma ; Xuesong, Xie ; Xiaoling, Zhang ; Lin, Chen ; Zhangchao, Wang
Author_Institution :
Coll. of Electron. Inf. & Control Eng., Beijing Univ. of Technol., Beijing, China
Abstract :
A novel model for activation energy calculation derived from the Arrhenius Equation is presented in this paper. Firstly, value assignment method is adopted to prove that the calculation error of model 1 is 13%, and the calculation error of model 2 is 1.57% while the calculation error is only 0.29% by using the novel model. The result testifies the higher precision of the new model. Secondly, the stability of the new model is verified by comparing the results of the three models mentioned above in the case of data fluctuation. The calculation error of model 1 is 9.14% and the error of extrapolated lifetime is 91.08% For model 2, the calculation error reaches 23.7% and the error of extrapolated lifetime is -80.86%. The calculation error is only 3% and the error of extrapolated lifetime is -25.3% by using the new model. Finally, to demonstrate the advantages of the novel model, experimental data is processed by using the three models, which shows that the lifetime acquired from the activation energy calculated with the novel model is more reasonable.
Keywords :
DC-DC power convertors; extrapolation; life testing; Arrhenius equation; DC-DC converter; activation energy calculation error; data fluctuation; extrapolated lifetime error; progressive-stress accelerated life testing; value assignment method; Computational modeling; Data models; Degradation; Fluctuations; Life estimation; Mathematical model; Stress; Arrhenius Equation; activation energy; progressive-stress accelerated test;
Conference_Titel :
Electronics, Communications and Control (ICECC), 2011 International Conference on
Conference_Location :
Ningbo
Print_ISBN :
978-1-4577-0320-1
DOI :
10.1109/ICECC.2011.6067653
