Application of spectral estimation techniques to correct the reflection from imperfect absorbing boundaries in the FDTD simulation of microwave circuits

Author

Naishadham, K. ; Xing Ping Lin

Author_Institution

Dept. of Electr. Eng., Wright State Univ., Dayton, OH, USA

fYear

1994

fDate

23-27 May 1994

Firstpage

361

Abstract

Residual reflection from absorbing boundaries that truncate the computational mesh in the finite-difference time-domain method introduces significant error in the characterization of transmission lines and discontinuities employed in microwave and millimeter-wave integrated circuits. We apply the least squares Prony´s method to accurately estimate the complex reflection coefficient in the frequency domain by representing the sampled electric field of a microstrip transmission line as a plane wave super-position of incident and reflected waves. This estimate is used to correct the effective dielectric constant of the line over a wide frequency range, which corroborates well with published results.<>

Keywords

circuit analysis computing; finite difference time-domain analysis; least squares approximations; microstrip lines; microwave integrated circuits; permittivity; spectral-domain analysis; transmission line theory; FDTD simulation; absorbing boundaries; complex reflection coefficient; computational mesh; discontinuities; effective dielectric constant; error; finite-difference time-domain method; frequency domain; least squares Prony method; microstrip transmission line; microwave circuits; microwave integrated circuits; millimeter-wave integrated circuits; plane wave super-position; residual reflection; sampled electric field; spectral estimation; Distributed parameter circuits; Finite difference methods; Frequency domain analysis; Frequency estimation; Least squares approximation; Microwave theory and techniques; Millimeter wave integrated circuits; Reflection; Time domain analysis; Transmission line discontinuities;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Symposium Digest, 1994., IEEE MTT-S International

Conference_Location

San Diego, CA, USA

ISSN

0149-645X

Print_ISBN

0-7803-1778-5

Type

conf

DOI

10.1109/MWSYM.1994.335305

Filename

335305