Title :
Mining Maximal Patterns Based on Improved FP-tree and Array Technique
Author :
Wang, Hua-jin ; Hu, Chun-an
Author_Institution :
Sch. of Inf. Eng., Jiangxi Univ. of Sci. & Technol., Ganzhou, China
Abstract :
Mining frequent patterns is important for mining association rules. However, because of the inherent complexity, mining complete frequent patterns from a dense database could be impractical, and the quantity of the mined patterns is usually very large, it is hard to understand and make use of them. Maximal frequent patterns contain and compress all frequent patterns, and the memory needed for saving them is much smaller than that needed for saving complete patterns, thus it is greatly valuable to mine maximal frequent patterns. In this paper, the structure of a traditional FP-tree is improved , an efficient algorithm for mining maximal frequent patterns based on improved FP-tree and array technique, called IAFP-max, is presented. By introducing the concept of postfix sub-tree, the presented algorithm needn´t generate the candidate of maximal frequent patterns in mining process and therefore greatly reduces the memory consume, and it also uses an array-based technique to reduce the traverse time to the improved FP-tree. The experimental evaluation shows that this algorithm outperforms most exiting algorithms MAFIA, GenMax and FPmax*.
Keywords :
data mining; pattern recognition; trees (mathematics); FP-tree structure; IAFP-max; array technique; association rule mining; frequent pattern mining; maximal pattern mining; memory consumption; postfix sub-tree; Association rules; Data mining; Data security; Frequency; Informatics; Information security; Information technology; Itemsets; Testing; Transaction databases; Array technique; Data mining; Improved FP-tree; Maximal frequent pattern;
Conference_Titel :
Intelligent Information Technology and Security Informatics (IITSI), 2010 Third International Symposium on
Conference_Location :
Jinggangshan
Print_ISBN :
978-1-4244-6730-3
Electronic_ISBN :
978-1-4244-6743-3
DOI :
10.1109/IITSI.2010.185