Title :
March SS: a test for all static simple RAM faults
Author :
Hamdioui, Said ; Van de Goor, Ad J. ; Rodgers, Mike
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
This paper presents all simple (i.e., not linked) static fault models that have been shown to exist for random access memories (RAMs), and shows that none of the current industrial march tests has the capability to detect all these faults. It therefore introduces a new test (March SS), with a test length of 22n, that detects all realistic simple static faults in RAMs.
Keywords :
fault simulation; integrated circuit testing; integrated memory circuits; random-access storage; March SS; RAMs; fault coverage; march tests; static fault models; static simple RAM faults; test length; Circuit faults; Circuit testing; Costs; Coupling circuits; Electrical fault detection; Fault detection; Random access memory; Read-write memory; Semiconductor device testing; Ultra large scale integration;
Conference_Titel :
Memory Technology, Design and Testing, 2002. (MTDT 2002). Proceedings of the 2002 IEEE International Workshop on
Print_ISBN :
0-7695-1617-3
DOI :
10.1109/MTDT.2002.1029769
