DocumentCode :
2194739
Title :
EigenDiagnostics: Spotting Connection Patterns and Outliers in Large Graphs
Author :
Maruhashi, Koji ; Faloutsos, Christos
Author_Institution :
Fujitsu Labs. Ltd., Atsugi, Japan
fYear :
2010
fDate :
13-13 Dec. 2010
Firstpage :
1328
Lastpage :
1337
Abstract :
In a large weighted graph, how can we detect suspicious sub graphs, patterns, and outliers? A suspicious pattern could be a near-clique or a set of nodes bridging two or more near-cliques. This would improve intrusion detection in computer networks and network traffic monitoring. Are there other network patterns that need to be detected? We propose EigenDiagnostics, a fast algorithm that spots such patterns. The process creates scatter-plots of the node properties (such as eigenscores, degree, and weighted degree), then looks for linear-like patterns. Our tool automatically discovers such plots, using the Hough transform from machine vision. We apply EigenDiagnostics on a wide variety of synthetic and real data (LBNL computer traffic, movie-actor data from IMDB, Patent citations, and more). EigenDiagnostics finds surprising patterns. They appear to correspond to port-scanning (in computer networks), repetitive tasks with bot-net-like behavior, strange "gbridges" in movie-actor data (due to actors changing careers, for example), and more. The advantages are: (a) it is effective in discovering surprising patterns. (b) it is fast (linear on the number of edges) (c) it is parameter-free, and (d) it is general, and applicable to many, diverse graphs, spanning tens of GigaBytes.
Keywords :
Hough transforms; data mining; EigenDiagnostics; Hough transform; computer networks; intrusion detection; machine vision; network traffic monitoring; spotting connection patterns; Anomaly detection; Graph mining; Hough Transform; Singular Value Decomposition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Data Mining Workshops (ICDMW), 2010 IEEE International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-9244-2
Electronic_ISBN :
978-0-7695-4257-7
Type :
conf
DOI :
10.1109/ICDMW.2010.203
Filename :
5693447
Link To Document :
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