DocumentCode :
2194963
Title :
Reliability evaluation of distribution system through the analysis of time-varying failure rate
Author :
Moon, Jong-Fil ; Kim, Jae-Chul ; Lee, Hee-Tae ; Park, Chang-Ho ; Yun, Sang-Yun ; Lee, Sang-Seung
Author_Institution :
Dept. of Electr., Soongsil Univ., Seoul, South Korea
fYear :
2004
fDate :
6-10 June 2004
Firstpage :
668
Abstract :
In this paper, the time-varying failure rate (TFR) of power distribution system components is extracted from the recorded failure data of KEPCO (Korean electric power corporation) in Korea and the reliability of power distribution system are evaluated using mean failure rate (MFR) and TFR. The TFR is approximated to bathtub curve using the exponential and Weibull distribution function. In addition, Kaplan-Meier estimation is applied to TFR extraction because of incomplete failure data of KEPCO. Also the reliability of the real power distribution system of Korea is evaluated using the MFR and TFR extracted from real failure data, respectively and the results of each case are compared with each other. As a result, it is proved that the reliability evaluation using the TFR is more realistic than MFR. In addition, it is presented that the application method at power distribution system maintenance and repair using the result of TFR.
Keywords :
Weibull distribution; maintenance engineering; power distribution reliability; reliability; KEPCO; Kaplan-Meier estimation; Korean electric power corporation; Weibull distribution function; mean failure rate; power distribution system maintenance; power distribution system reliability; reliability evaluation; time-varying failure rate analysis; Data mining; Failure analysis; Maintenance; Moon; Power distribution; Power system management; Power system reliability; Student members; Time varying systems; Weibull distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Engineering Society General Meeting, 2004. IEEE
Print_ISBN :
0-7803-8465-2
Type :
conf
DOI :
10.1109/PES.2004.1372895
Filename :
1372895
Link To Document :
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