DocumentCode :
2195060
Title :
Immune System Modeling with Infer.NET
Author :
Tan, Vincent Y F ; Winn, John ; Simpson, Angela ; Custovic, Adnan
Author_Institution :
Lab. for Inf. & Decision Syst., Massachusetts Inst. of Technol., MA, USA
fYear :
2008
fDate :
7-12 Dec. 2008
Firstpage :
364
Lastpage :
365
Abstract :
Graphical models allow scientific prior knowledge to be incorporated into the statistical analysis of data, whilst also providing a vivid way to represent and communicate this knowledge. In this paper we develop a graphical model of the immune system as a means of analyzing immunological data from the Manchester asthma and allergy study (MAAS). The analysis is achieved using the Infer.NET tool which allows Bayesian inference to be applied automatically to a specified graphical model.Our immune system model consists firstly of a hidden Markov model representing how allergen-specific skin prick tests (SPTs) and serum-specific IgE tests (SITs) change over time. By introducing a latent multinomial variable, we also cluster the children in an unsupervised manner into different sensitization classes. For 2 sensitization classes, the children who are vulnerable to allergies and have a high probability of having asthma (22%) are identified. For 5 sensitization classes, children in the first cluster, those who are vulnerable to allergies, have an even higher probability of having asthma (42%). The second part of the model involves using the inferred sensitization class as a label and 8 exposure variables in a Bayes point machine. Using multiple permutation tests, we conclude that the level of endotoxins and gender have a significant effect on a child´s vulnerability to allergies.
Keywords :
belief networks; data analysis; hidden Markov models; inference mechanisms; medical computing; statistical analysis; Bayes point machine; Manchester asthma and allergy study; allergen-specific skin prick tests; data analysis; graphical models; hidden Markov model; immune system modeling; latent multinomial variable; statistical analysis; Bayesian methods; Data analysis; Genetics; Graphical models; Hidden Markov models; Immune system; Pediatrics; Skin; Statistical analysis; System testing; Graphical Modeling; Immune System;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
eScience, 2008. eScience '08. IEEE Fourth International Conference on
Conference_Location :
Indianapolis, IN
Print_ISBN :
978-1-4244-3380-3
Electronic_ISBN :
978-0-7695-3535-7
Type :
conf
DOI :
10.1109/eScience.2008.91
Filename :
4736798
Link To Document :
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