DocumentCode
2195559
Title
Multiscale thermal design of MCMs with high resolution unstructured adaptive simulation tools
Author
Przekwas, Andrzej J. ; Jiang, Yu ; Tan, Zhiqiang Q.
Author_Institution
CFD Res. Corp., Huntsville, AL, USA
fYear
1997
fDate
4-5 Feb 1997
Firstpage
73
Lastpage
82
Abstract
A novel computational approach, VPE, has been presented for multi-scale analysis of electronics packaging/cooling. The VPE software system has been designed for fully automated model assembly, grid generation based on compact, reusable electronic component database representation, interactive design, and visualization. Advanced thermal analysis code, CFD-ACE, has been developed with unstructured, solution adaptive grid. The paper has demonstrated a novel concept of unstructured solution adaptive grids for high resolution flow and thermal analysis of electronics components and boards. It was demonstrated on detailed 3D heat transfer studies of MCMs and their assemblies. It has also been demonstrated that a high fidellity multi-scale thermal analysis is possible in which 3D air flow/heat transfer is solved simultaneously with detailed heat condition within individual electronics components. At present, the VPE is being extended for fully automatic design starting from the geometry definition up to the visualization step. A thermal stress module is being linked for full thermo-mechanical analysis
Keywords
cooling; digital simulation; integrated circuit packaging; multichip modules; thermal analysis; 3D heat transfer studies; CFD-ACE; MCMs; VPE; cooling; electronic component database representation; electronics packaging; fully automated model assembly; geometry definition; grid generation; interactive design; multiscale thermal design; solution adaptive grid; thermal analysis code; thermo-mechanical analysis; unstructured adaptive simulation tools; Assembly systems; Electronic components; Electronic packaging thermal management; Electronics cooling; Electronics packaging; Heat transfer; Mesh generation; Software systems; Thermal stresses; Visualization;
fLanguage
English
Publisher
ieee
Conference_Titel
Multi-Chip Module Conference, 1997. MCMC '97., 1997 IEEE
Conference_Location
Santa Cruz, CA
Print_ISBN
0-8186-7789-9
Type
conf
DOI
10.1109/MCMC.1997.569348
Filename
569348
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