Title :
The influence of pseudo-random numbers on yield analysis and optimization of microwave circuits
Author :
Yi Huang ; Chuyu Sheng
Author_Institution :
State Key Lab. of Millimeter Waves, Southeast Univ., Nanjing, China
Abstract :
In this paper, we analyze four sorts of Pseudo-Random Number (PRN) generators which are widely used in microwave circuit yield analysis and optimization, show that some PRN generators do not satisfy the requirements of simulating statistical models of circuit parameters, and reveal the influence of PRN statistical characteristic on yield analysis and optimization of microwave circuits. Finally, we give some suggestions worth of attention on establishing statistical models of microwave circuits and yield optimization.<>
Keywords :
microwave circuits; network parameters; random number generation; statistical analysis; circuit parameters; microwave circuits; pseudo-random number generators; statistical models; yield analysis; yield optimization; Analytical models; Character generation; Circuit analysis; Circuit simulation; Microwave circuits; Microwave generation;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335411
