DocumentCode :
2195711
Title :
High-frequency time-domain modeling of GaAs FETs using hydrodynamic model coupled with Maxwell´s equations
Author :
AlSunaidi, M.A. ; El-Ghazaly, S.M.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
1994
fDate :
23-27 May 1994
Firstpage :
397
Abstract :
A high frequency full wave model for microwave and millimeter wave GaAs Field Transistors (FET) is presented. The consists of two coupled models for the solid-state and electromagnetic parts of the problem. In the solid-state part, a hydrodynamic model consisting of the conservation equations for carrier density, energy, and momentum is utilized. All the conservation equations are solved with minimum simplifications. On the electromagnetic side, a 3D model consisting of Maxwell´s equations is used. The time domain simulation of the device is performed using finite difference method. Numerical results of the presented model for a 0.5 /spl mu/m MESFET show that wave effect plays a crucial role in modulating fields and electron velocities inside the active device. The wave propagation is detected and found to cause considerable variations in field distribution and electron velocities.<>
Keywords :
III-V semiconductors; Maxwell equations; Schottky gate field effect transistors; carrier density; finite difference time-domain analysis; gallium arsenide; semiconductor device models; solid-state microwave devices; 0.5 micron; GaAs; GaAs FETs; MESFET; Maxwell´s equations; carrier density; conservation equations; coupled models; electromagnetic problem; electron velocities; finite difference method; high frequency full wave model; hydrodynamic model; microwave FETs; millimeter wave FETs; solid-state part; time-domain modeling; wave effect; Electromagnetic coupling; Electromagnetic modeling; Electrons; Gallium arsenide; Hydrodynamics; Maxwell equations; Microwave FETs; Solid modeling; Solid state circuits; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
ISSN :
0149-645X
Print_ISBN :
0-7803-1778-5
Type :
conf
DOI :
10.1109/MWSYM.1994.335416
Filename :
335416
Link To Document :
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