DocumentCode
2195732
Title
Interpolative response modeling for Monte Carlo simulation
Author
Campbell, L. ; Purviance, J.
Author_Institution
Nippondenso Tech. Center, Carlsbad, CA, USA
fYear
1994
fDate
23-27 May 1994
Firstpage
401
Abstract
A statistical interpolation technique is presented for statistically modeling circuit response error measurements. These models are used to accelerate Monte Carlo yield estimation as a control variate model.<>
Keywords
III-V semiconductors; Monte Carlo methods; circuit analysis computing; gallium arsenide; interpolation; solid-state microwave circuits; statistical analysis; GaAs FET circuits; Monte Carlo simulation; circuit response error measurements; control variate model; interpolative response modeling; microwave circuits; statistical interpolation technique; yield estimation; Acceleration; Circuits; Interpolation; Monte Carlo methods; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location
San Diego, CA, USA
ISSN
0149-645X
Print_ISBN
0-7803-1778-5
Type
conf
DOI
10.1109/MWSYM.1994.335417
Filename
335417
Link To Document