Title :
Interpolative response modeling for Monte Carlo simulation
Author :
Campbell, L. ; Purviance, J.
Author_Institution :
Nippondenso Tech. Center, Carlsbad, CA, USA
Abstract :
A statistical interpolation technique is presented for statistically modeling circuit response error measurements. These models are used to accelerate Monte Carlo yield estimation as a control variate model.<>
Keywords :
III-V semiconductors; Monte Carlo methods; circuit analysis computing; gallium arsenide; interpolation; solid-state microwave circuits; statistical analysis; GaAs FET circuits; Monte Carlo simulation; circuit response error measurements; control variate model; interpolative response modeling; microwave circuits; statistical interpolation technique; yield estimation; Acceleration; Circuits; Interpolation; Monte Carlo methods; Yield estimation;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335417
