Title :
Low cost test solution for IDDQ
Author :
Thomas, Bob ; Andlauer, Rick
Author_Institution :
Cadence Design Syst. Inc., San Jose, CA, USA
Abstract :
This paper describes a medium-speed, reliable and cost effective method of doing IDDQ testing. This method utilizes standard resources available on typical automatic test equipment (ATE) systems which do not have specialized IDDQ measurement hardware. This is a practical solution that can be implemented at a low cost and minimal resources.
Keywords :
automatic testing; integrated circuit testing; IDDQ testing; automatic test equipment; low cost technique; Circuit testing; Clamps; Costs; Current measurement; Force measurement; Measurement units; Phasor measurement units; Relays; System testing; Voltage;
Conference_Titel :
IDDQ Testing, 1996., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-7655-8
DOI :
10.1109/IDDQ.1996.557813
