DocumentCode :
2196242
Title :
KNaNbO3-LiTaO3-LiSbO3 Thin Films by Pulsed Laser Deposition
Author :
Abazari, M. ; Kerman, K. ; Simon, W.K. ; Akdogan, E.K. ; Safari, A.
Author_Institution :
Rutgers-The State Univ. of New Jersey, Pistcaway
fYear :
2006
fDate :
July 30 2006-Aug. 3 2006
Firstpage :
311
Lastpage :
313
Abstract :
Morphotropic phase boundary composition KNaNbO3-LiTaO3-LiSbO3 (KNN-LT-LS) thin films were grown by pulsed laser deposition on niobium doped conductive SrTiO3 substrates. Using X-ray diffractometry, the phase evolution, stoichiometry, and growth orientation were monitored for various deposition conditions including temperature and ambient oxygen partial pressure. The results indicate that the scattering of the cations such as potassium, sodium, and lithium by the oxygen molecules is a very critical factor in the formation of the secondary phases in the films. We report thin films with a good crystallinity grown at 650degC and in ambient oxygen partial pressure. On 1 micron films, a longitudinal relative permittivity of 500, along with a loss tangent of 0.5% at 1 MHz has been obtained.
Keywords :
X-ray diffraction; dielectric losses; ferroelectric materials; ferroelectric thin films; lithium compounds; permittivity; potassium compounds; pulsed laser deposition; sodium compounds; stoichiometry; KNaNbO3-LiTaO3-LiSbO3; SrTiO3; X-ray diffractometry; ambient oxygen partial pressure; cation scattering; critical factor; crystallinity; deposition temperature; ferroelectric thin films; growth orientation; lithium cations; longitudinal relative permittivity; loss tangent; morphotropic phase boundary composition; niobium doped conductive substrates; oxygen molecules; phase evolution; potassium cations; pulsed laser deposition; secondary phase formation; size 1 micron; sodium cations; stoichiometry; temperature 650 degC; Condition monitoring; Conductive films; Niobium; Optical pulses; Pulsed laser deposition; Sputtering; Temperature; X-ray diffraction; X-ray lasers; X-ray scattering; KNN-LT-LS; Pulsed laser deposition; Thin film; X-ray diffraction pattern;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Applications of ferroelectrics, 2006. isaf '06. 15th ieee international symposium on the
Conference_Location :
Sunset Beach, NC
ISSN :
1099-4734
Print_ISBN :
978-1-4244-1331-7
Electronic_ISBN :
1099-4734
Type :
conf
DOI :
10.1109/ISAF.2006.4387894
Filename :
4387894
Link To Document :
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