DocumentCode
2196642
Title
16th Asian Test Symposium - Title page
fYear
2007
fDate
8-11 Oct. 2007
Abstract
The following topics are dealt with: fault modeling and functional test; fault diagnosis; delay test; test compression; power aware test; DFT; RF test; software test; design verification; SOC test; analog test; test generation; soft error issue; memory test; BIST; current test and analog production test.
Keywords
automatic test pattern generation; built-in self test; data compression; design for testability; fault diagnosis; system-on-chip; BIST; DFT; RF test; SOC test; analog production test; analog test; current test; delay test; design verification; fault diagnosis; fault modeling; functional test; memory test; power aware test; soft error issue; software test; test compression; test generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.1
Filename
4387960
Link To Document