Natural and accelerated aging of composite insulators

Author

Garcia, Ricardo W S ; Torres, Márcio S. ; Silva, Fernando R., Jr. ; Gomes, Edegard, Jr. ; Bade, Sergio A. ; Argolo, José A. ; Resende, Gerson V. ; Paiva, Osvaldo L. ; Medeiros, Rachel S. ; Oliveira, Luiz A. ; Assad, Luiz A X ; Antunes, Eugênio P. ; Dos Sa

Author_Institution

Centro de Pesquisas de Energia Eletrica, CEPEL, Rio de Janeiro, Brazil

Volume

2

fYear

1998

fDate

7-10 Jun 1998

Firstpage

329

Abstract

Composite insulators or nonceramic insulators (NCIs), as they are also known, represent a relatively new technology applicable to transmission line insulation. Although they have been used for the last three decades in many countries, several aspects regarding materials, design, applications, specifications, testing, maintenance and aging are not well established yet. This paper presents the results of a research project developed by CEPEL (a Brazilian Electrical Power Research Center) and some utilities together. It aims at performance evaluation of different NCIs submitted to accelerated and natural aging. The conclusions taken from the accelerated aging tests show the influence of insulator design, leakage distance and housing material on the electrical performance of different NCIs. The results of field investigation show some degradation that does not imply in reduction of electrical or mechanical properties of the insulators up to now

Keywords

ageing; composite insulators; insulator testing; life testing; CEPEL; accelerated aging; composite insulators; design; electrical properties; housing material; insulator design; leakage distance; maintenance; materials; mechanical properties; natural aging; nonceramic insulators; performance evaluation; testing; transmission line insulation; Accelerated aging; Degradation; Dielectrics and electrical insulation; Glass; Insulator testing; Manufacturing; Materials testing; Pollution; Power transmission lines; Rubber;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on

Conference_Location

Arlington, VA

ISSN

1089-084X

Print_ISBN

0-7803-4927-X

Type

conf

DOI

10.1109/ELINSL.1998.694802

Filename

694802