Title :
A fast and sensitive built-in current sensor for IDDQ testing
Author :
Lu, Chih-Wen ; Lee, Chung Len ; Chen, Jwu-E
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.
Keywords :
CMOS integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; I-V converter; IDDQ testing; built-in current sensor; current mirror; static CMOS IC; Circuit simulation; Circuit testing; Latches; Mirrors; Sensor systems; Size control; Switches; Switching circuits; System testing; Voltage control;
Conference_Titel :
IDDQ Testing, 1996., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-7655-8
DOI :
10.1109/IDDQ.1996.557816
