DocumentCode
2196923
Title
A fast and sensitive built-in current sensor for IDDQ testing
Author
Lu, Chih-Wen ; Lee, Chung Len ; Chen, Jwu-E
Author_Institution
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear
1996
fDate
24-25 Oct. 1996
Firstpage
56
Lastpage
58
Abstract
In this work, a fast and highly sensitive Built-in Current (BIC) sensor is proposed for testing static CMOS ICs. The sensor employs a current mirror and an I-V converter to achieve the high sensing speed and high resolution. The circuit is simple and occupies a small area, making it ideal to be integrated into the IC chip for the IDDQ application.
Keywords
CMOS integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; I-V converter; IDDQ testing; built-in current sensor; current mirror; static CMOS IC; Circuit simulation; Circuit testing; Latches; Mirrors; Sensor systems; Size control; Switches; Switching circuits; System testing; Voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
IDDQ Testing, 1996., IEEE International Workshop on
Conference_Location
Washington, DC, USA
Print_ISBN
0-8186-7655-8
Type
conf
DOI
10.1109/IDDQ.1996.557816
Filename
557816
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