• DocumentCode
    2197399
  • Title

    A Novel Neural Network-Based Approach for Multiple Instance Learning

  • Author

    Li, Cheng Hua ; Gondra, Iker

  • Author_Institution
    Dept. of Math., Stat. & Comput., St. Francis Xavier Univ., Antigonish, NS, Canada
  • fYear
    2010
  • fDate
    June 29 2010-July 1 2010
  • Firstpage
    451
  • Lastpage
    456
  • Abstract
    This paper proposes a new multiple instance learning (MIL) method based on a MIL back-propagation neural network (MIBP), which is an extension of the standard back-propagation neural network (BPNN) that uses labeled bags of instances as training data. The method finds a concept point t in the feature space which is close to instances from positive bags and far from instances in negative bags. Our method is as follows: First, train MIBP with positive and negative bags. Second, extract t from the trained MIBP. This is achieved by, for each positive bag, presenting all the instances to the trained MIBP and selecting the one with maximal output value. The t is then obtained by averaging all the extracted instances. Finally, a sensitivity analysis of the trained MIBP is performed to obtain feature relevance/weighting information. We conducted experiments to measure the performance of the obtained t when used for classification purposes. The experimental results on the musk data set and a subset of the Corel image data set show that our method has better classification performance and is more computationally efficient than other well-established MIL methods.
  • Keywords
    backpropagation; image classification; neural nets; Corel image data set; MIL backpropagation neural network; multiple instance learning method; neural network-based approach; sensitivity analysis; Accuracy; Algorithm design and analysis; Artificial neural networks; Classification algorithms; Feature extraction; Shape; Training; BPNN; MIBP; diverse density; multiple instance learning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer and Information Technology (CIT), 2010 IEEE 10th International Conference on
  • Conference_Location
    Bradford
  • Print_ISBN
    978-1-4244-7547-6
  • Type

    conf

  • DOI
    10.1109/CIT.2010.103
  • Filename
    5578180