DocumentCode :
2197426
Title :
Thermoelectric properties of Ba8Al16Si30 Clathrate
Author :
Lee, Jung-Il ; Kim, Young-Ho ; Park, Seung-Hwan ; Ur, Soon-Chul ; Kim, Il-Ho
Author_Institution :
Dept. of Mater. Sci. & Eng./RIC-ReSEM, Chungju Nat. Univ., Chungju
fYear :
2007
fDate :
3-7 June 2007
Firstpage :
237
Lastpage :
240
Abstract :
Clathrate Ba8Al16Si30 was produced by arc melting and hot-pressed and effects on the microstructure and thermoelectric properties were investigated. The ingot was crushed into powders in a glove box. The powders were hot-pressed at 1,073, 1,123 and 1,173K using a stress of 60 MPa for 2 hours. The phase transformation behavior of hot-pressed Ba8Al16Si30 was examined by thermo-gravimetric analysis (TGA), differential scanning calorimetry (DSC), hardness test, X-ray diffraction and scanning electron microscope analyses. Seebeck coefficient (thermoelectric power), Thermal conductivity, Dimensionless-figure-of-merit (ZT), electrical conductivity and thermoelectric power factor were investigated from room temperature to 600 K. The hot-pressed and isothermal homegenized specimens represented n-type conduction at temperatures examined. Thermoelectric properties are compared hot-pressed samples to as-solidified and homogenized samples. Hot-pressed at 1,173 K using a stress of 60 MPa for 2 hours sample shows good thermoelctric properties at this examined conditions.
Keywords :
Seebeck effect; X-ray diffraction; aluminium alloys; barium alloys; differential scanning calorimetry; electrical conductivity; hardness; scanning electron microscopy; silicon alloys; solid-state phase transformations; thermal conductivity; thermoelectric power; Ba8Al16Si30; Seebeck coefficient; X-ray diffraction; arc melting; differential scanning calorimetry; dimensionless-figure-of-merit; electrical conductivity; hardness; hot pressing; ingot; microstructure; phase transformation; powders; room temperature; scanning electron microscope; temperature 1073 K; temperature 1123 K; temperature 1173 K; temperature 293 K to 600 K; thermal conductivity; thermo-gravimetric analysis; thermoelectric power; thermoelectric properties; time 2 hour; Calorimetry; Electrons; Microstructure; Powders; Temperature; Testing; Thermal conductivity; Thermal stresses; Thermoelectricity; X-ray diffraction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermoelectrics, 2007. ICT 2007. 26th International Conference on
Conference_Location :
Jeju Island
ISSN :
1094-2734
Print_ISBN :
978-1-4244-2262-3
Electronic_ISBN :
1094-2734
Type :
conf
DOI :
10.1109/ICT.2007.4569468
Filename :
4569468
Link To Document :
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