Fourier Spectrum-Based Signature Test: A Genetic CAD Toolbox for Reliable RF Testing Using Low-Performance Test Resources

Author

Srinivasan, G. ; Chatterjee, Avhishek ; Natarajan, Vivek

Author_Institution

Texas Instrum. Inc, Dallas

fYear

2007

fDate

8-11 Oct. 2007

Firstpage

139

Lastpage

142

Abstract

At the present time, coordinated EDA tools for RF/mixed-signal pin test do not exist. In this paper, a CAD tool for efficient production testing of high- performance RF systems using low-cost baseband ATE is presented The CAD tool consists of a custom developed genetic ATPG for spectral (Fourier spectrum) signature-based alternate (to full specification-based tests) test of RF systems and involves co-simulation of scalable behavioral-level models of the RF System-Under-Test, baseband ATE test instrumentation, loadboard resources, and DfT resources for fast test vector optimization/generation. The CAD tool also enables the evaluation of various low-cost ATE architectures on the impact of the generated tests to provide a cost-effective solution.

Keywords

automatic test equipment; automatic test pattern generation; circuit CAD; integrated circuit testing; radiofrequency integrated circuits; ATE; ATPG; Fourier spectrum; RF system under test; genetic CAD toolbox; loadboard resources; low performance test resources; reliable RF testing; signature test; test instrumentation; Automatic test pattern generation; Baseband; Circuit testing; Costs; Electronic design automation and methodology; Genetics; Instruments; Radio frequency; Sequential analysis; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Asian Test Symposium, 2007. ATS '07. 16th

Conference_Location

Beijing

ISSN

1081-7735

Print_ISBN

978-0-7695-2890-8

Type

conf

DOI

10.1109/ATS.2007.98

Filename

4387999