DocumentCode :
2197507
Title :
An Improved Test Case Generation Method of Pair-Wise Testing
Author :
Feng-An, Qian ; Jian-hui, Jiang
Author_Institution :
Tongji Univ., Shanghai
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
149
Lastpage :
154
Abstract :
Pair-wise testing is a testing criterion based on specification, which requires that for each pair of parameters, every combination of their valid value should be covered by at least one test case in the test set. This paper presents an improved method based on AETG. Experimental results show that the size of test set produced by our method is relatively small. In addition, the method can be easily implemented.
Keywords :
automatic test pattern generation; logic testing; AETG; pair-wise testing; test case generation method; Computer science; Computer science education; Costs; Diversity reception; Educational technology; Embedded computing; Embedded system; Laboratories; Software testing; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.65
Filename :
4388001
Link To Document :
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