DocumentCode
2197507
Title
An Improved Test Case Generation Method of Pair-Wise Testing
Author
Feng-An, Qian ; Jian-hui, Jiang
Author_Institution
Tongji Univ., Shanghai
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
149
Lastpage
154
Abstract
Pair-wise testing is a testing criterion based on specification, which requires that for each pair of parameters, every combination of their valid value should be covered by at least one test case in the test set. This paper presents an improved method based on AETG. Experimental results show that the size of test set produced by our method is relatively small. In addition, the method can be easily implemented.
Keywords
automatic test pattern generation; logic testing; AETG; pair-wise testing; test case generation method; Computer science; Computer science education; Costs; Diversity reception; Educational technology; Embedded computing; Embedded system; Laboratories; Software testing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.65
Filename
4388001
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