Title :
Time domain characterization of coupled interconnects and discontinuities
Author :
Jyh-Ming Jong ; Hayden, L.A. ; Tripathi, V.K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Oregon State Univ., Corvallis, OR, USA
Abstract :
A time domain experimental technique for the characterization and modeling of general coupled interconnects and discontinuities is presented. The technique is based on a two-dimensional peeling algorithm and is validated by comparing the results obtained experimentally for the self and mutual equivalent circuit parameters with the theoretical predictions for a non symmetrical inhomogeneous coupled interconnect test structure.<>
Keywords :
equivalent circuits; time-domain analysis; transmission line theory; coupled interconnects; discontinuities; modeling; mutual equivalent circuit parameters; nonsymmetrical inhomogeneous coupled interconnect test structure; self equivalent circuit parameters; time domain characterization; two-dimensional peeling algorithm; Automatic testing; Circuit testing; Coupling circuits; Equivalent circuits; Integrated circuit interconnections; Mutual coupling;
Conference_Titel :
Microwave Symposium Digest, 1994., IEEE MTT-S International
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-1778-5
DOI :
10.1109/MWSYM.1994.335542
