Title :
New insights into sampling strategies for imaging strongly scattering targets
Author :
Shahid, U. ; Fiddy, M.A.
Author_Institution :
Center for Optoelectron. & Opt. Commun., Univ. of North Carolina at Charlotte, Charlotte, NC, USA
Abstract :
Recent advances in methods to invert data from strongly scattering targets has revealed the need to rethink how best to sample the scattered field. For strongly scattering targets, the inversion procedure is inherently nonlinear and we show that usual sampling procedures based on Shannon sampling concepts are inadequate and some prior knowledge of the maximum permittivity or refractive index of the target plays an important role.
Keywords :
image reconstruction; image sampling; scattering; Shannon image sampling strategies; inversion procedure; scattering targets; Approximation methods; Cepstral analysis; Diffraction; Filtering; Image reconstruction; Inverse problems; Nonlinear filters; Optical scattering; Permittivity measurement; Sampling methods;
Conference_Titel :
IEEE SoutheastCon 2010 (SoutheastCon), Proceedings of the
Conference_Location :
Concord, NC
Print_ISBN :
978-1-4244-5854-7
DOI :
10.1109/SECON.2010.5453837
