DocumentCode
2197825
Title
Test Point Selections for a Programmable Gain Amplifier Using NIST and Wavelet Transform Methods
Author
Zhang, Xinsong ; Ang, Simon S. ; Carter, Chandra
Author_Institution
Univ. of Arkansas, Fayetteville
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
230
Lastpage
238
Abstract
Test point selections for a programmable gain amplifier (PGA) using the National Institute of Standard (NIST) and wavelet transform methods are investigated. Although the wavelet transform method is an efficient method in test point selection for many mixed-signal devices, for a PGA with 31 input steps, the NIST method is shown to be more accurate in predicting the output gain responses than the wavelet transform method.
Keywords
amplifiers; integrated circuit testing; mixed analogue-digital integrated circuits; programmable circuits; wavelet transforms; NIST; National Institute of Standard; PGA; mixed-signal devices; programmable gain amplifier; test point selections; wavelet transform methods; Automatic testing; Circuit testing; Electronics packaging; Gain measurement; NIST; Performance gain; Predictive models; USA Councils; Voltage; Wavelet transforms;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.28
Filename
4388018
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