• DocumentCode
    2197850
  • Title

    Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits

  • Author

    Azaïs, F. ; Larguier, L. ; Renovell, M.

  • Author_Institution
    CNRS/Univ. of Montpellier, Montpellier
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    239
  • Lastpage
    244
  • Abstract
    This paper analyzes the logic errors in digital circuits due to the presence of simultaneous switching noise (SSN). It is demonstrated that 2 conditions must be fulfilled in order to guarantee the correct logic behaviour of a digital circuits. The first condition called ´minimum switch condition´ is proved to be fulfilled whatever the amount of SSN in the power and ground lines. The second condition called ´signal coherence condition´ is proved to be fulfilled within power coherent logic blocks. However the interface between non-coherent logic blocks may originate logic dysfunction. DFT and ATPG recommendations are derived from this analysis.
  • Keywords
    CMOS logic circuits; automatic test pattern generation; buffer circuits; discrete Fourier transforms; integrated circuit design; integrated circuit noise; integrated circuit testing; minimisation of switching nets; ATPG recommendations; DFT recommendations; digital CMOS circuits; logic errors; minimum switch condition; noncoherent logic blocks; power coherent logic blocks; signal coherence condition; simultaneous switching noise; static behavior; Automatic test pattern generation; CMOS digital integrated circuits; CMOS logic circuits; Circuit analysis; Circuit noise; Digital circuits; Error analysis; Logic circuits; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.73
  • Filename
    4388019