DocumentCode :
2197850
Title :
Impact of Simultaneous Switching Noise on the Static behavior of Digital CMOS Circuits
Author :
Azaïs, F. ; Larguier, L. ; Renovell, M.
Author_Institution :
CNRS/Univ. of Montpellier, Montpellier
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
239
Lastpage :
244
Abstract :
This paper analyzes the logic errors in digital circuits due to the presence of simultaneous switching noise (SSN). It is demonstrated that 2 conditions must be fulfilled in order to guarantee the correct logic behaviour of a digital circuits. The first condition called ´minimum switch condition´ is proved to be fulfilled whatever the amount of SSN in the power and ground lines. The second condition called ´signal coherence condition´ is proved to be fulfilled within power coherent logic blocks. However the interface between non-coherent logic blocks may originate logic dysfunction. DFT and ATPG recommendations are derived from this analysis.
Keywords :
CMOS logic circuits; automatic test pattern generation; buffer circuits; discrete Fourier transforms; integrated circuit design; integrated circuit noise; integrated circuit testing; minimisation of switching nets; ATPG recommendations; DFT recommendations; digital CMOS circuits; logic errors; minimum switch condition; noncoherent logic blocks; power coherent logic blocks; signal coherence condition; simultaneous switching noise; static behavior; Automatic test pattern generation; CMOS digital integrated circuits; CMOS logic circuits; Circuit analysis; Circuit noise; Digital circuits; Error analysis; Logic circuits; Switches; Switching circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.73
Filename :
4388019
Link To Document :
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